Difference between revisions of "Topics:PCG Portfolio"
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;Elastic properties | ;Elastic properties | ||
| − | + | * Strain-stress relations | |
| − | + | * Pressure effects | |
| − | Bulk properties | + | ;Bulk properties |
| − | + | * Thermal expansion in crystals | |
| − | + | * Atomic displacement parameters: relationship with phonons and specific heat. | |
| − | Magnetic structures | + | ;Magnetic structures |
| − | + | * Description of magnetic structures – propagation vectors | |
| − | + | * Magnetic symmetry analysis – irreps and coreps | |
| − | + | * Spin density determination with polarised neutrons. | |
| − | + | * XYZ and spherical polarimetry applied to crystalline materials | |
| − | Microstructure analysis | + | ; Microstructure analysis |
| − | + | * Strain effects | |
| − | + | * Particle size and distribution | |
| − | + | * Stacking faults | |
| − | + | * Texture | |
| − | Diffraction methods | + | ; Diffraction methods |
| − | + | * CW neutron and x-rays | |
| − | + | * TOF neutrons | |
| − | + | * Energy dispersive x-rays | |
| − | + | * Diffraction imaging – TEDDI etc. | |
| − | + | * Time-resolved crystallography | |
| − | + | * Crystallography under high pressure | |
| − | + | * High-magnetic-field crystallography | |
| − | + | * SX techniques: Laue, time-sorted Laue… | |
| − | Data analysis | + | ;Data analysis |
| − | + | * Refinement of structural parameters –least square – Rietveld | |
| − | + | * Direct-space methods – simulated annealing | |
| − | + | * Single-crystal techniques – twinning | |
| − | Instrumentation | + | ;Instrumentation |
| − | + | * Diffraction geometries | |
| − | + | * Principles of TOF/CW instrument design | |
| − | + | * Detector technologies of X-rays and neutrons | |
Revision as of 09:53, 2 March 2007
PCG – Educational portfolio
- Crystal structures and their transformations
- Space Group Symmetry
- Symmetry lowering
- Structural phase transitions – Landau theory
- Representation analysis
- Tensors in crystallography
- Charge density
- Modulated crystal structures – Superspace group approach
- Elastic properties
- Strain-stress relations
- Pressure effects
- Bulk properties
- Thermal expansion in crystals
- Atomic displacement parameters: relationship with phonons and specific heat.
- Magnetic structures
- Description of magnetic structures – propagation vectors
- Magnetic symmetry analysis – irreps and coreps
- Spin density determination with polarised neutrons.
- XYZ and spherical polarimetry applied to crystalline materials
- Microstructure analysis
- Strain effects
- Particle size and distribution
- Stacking faults
- Texture
- Diffraction methods
- CW neutron and x-rays
- TOF neutrons
- Energy dispersive x-rays
- Diffraction imaging – TEDDI etc.
- Time-resolved crystallography
- Crystallography under high pressure
- High-magnetic-field crystallography
- SX techniques: Laue, time-sorted Laue…
- Data analysis
- Refinement of structural parameters –least square – Rietveld
- Direct-space methods – simulated annealing
- Single-crystal techniques – twinning
- Instrumentation
- Diffraction geometries
- Principles of TOF/CW instrument design
- Detector technologies of X-rays and neutrons
